A new analytical inductance extraction technique of on-wafer spiral inductors

Shima, Hideki; Matsuoka, Toshimasa; Taniguchi, Kenji

IEEE International Conference on Microelectronic Test Structures, 2004, 279-283

Number of Access:592（2025-08-14 05:02 Counts）

Identifier to cite or link to this item: https://hdl.handle.net/11094/14067

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Title
A new analytical inductance extraction technique of on-wafer spiral inductors
Creator
CreatorName
Shima, Hideki
NRID
1000080324820 1000080324820
ORCID
0000-0003-3876-2679 0000-0003-3876-2679
researchmap permalink
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Scopus Author ID
7402741552 7402741552
CreatorName
Matsuoka, Toshimasa
NRID
1000020192180 1000020192180
CreatorName
Taniguchi, Kenji
Publisher
IEEE
Source Title
IEEE International Conference on Microelectronic Test Structures
Page
279-283
Date of Issued
2004-03
Language
English
Handle URL
https://hdl.handle.net/11094/14067
Access Rights
open access
CopyRight
c2004 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE..
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Version of Record
Category
会議発表論文 Conference Paper