New 2-Factor Covering Designs for Software Testing

Kobayashi, Noritaka; Tsuchiya, Tatsuhiro; Kikuno, Tohru

IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences, 2002, E85-A(12), 2946-2949

Number of Access:3972025-09-03 07:55 Counts

Identifier to cite or link to this item: https://hdl.handle.net/11094/27244

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File Format Terms of use Size Views Date.Available Description information
IEICE_E85-A_12_2946 pdf None 186 KB 130 2014.04.03  

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