Watch-dog Circuit for Quality Guarantee with Subthreshold MOSFET Current

Hirose, Tetsuya; Yoshimura, Ryuji; Ido, Toru et al.

IEICE Transactions on Electronics, 2004, E87-C(11), 1910-1914

Number of Access:282（2025-08-14 06:03 Counts）

Identifier to cite or link to this item: https://hdl.handle.net/11094/51705

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Title
Watch-dog Circuit for Quality Guarantee with Subthreshold MOSFET Current
Creator
CreatorName
Hirose, Tetsuya
CreatorName
Yoshimura, Ryuji
CreatorName
Ido, Toru
NRID
1000080324820 1000080324820
ORCID
0000-0003-3876-2679 0000-0003-3876-2679
researchmap permalink
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Scopus Author ID
7402741552 7402741552
CreatorName
Matsuoka, Toshimasa
NRID
1000020192180 1000020192180
CreatorName
Taniguchi, Kenji
Subject
CMOS
subthreshold current
ultra-low-power
temperature dependence
Abstract
We propose an ultra low power watch-dog circuit with the use of MOSFETs operation under subthreshold characteristics. The circuit monitors the amount of the product degradation because the subthreshold current of MOSFET emulates the rate of the general chemical reaction. Its operation was verified with both SPICE simulation and the measurement of the prototype chip. The new circuit embedded in a tag attached to any product could dynamically monitor the degradation regardless of storage conditions.
Publisher
電子情報通信学会
The Institute of Electronics, Information and Communication Engineers
デンシ　ジョウホウ　ツウシン　ガッカイ
Source Title
IEICE Transactions on Electronics
Volume (Issue)
E87-C(11)
Page
1910-1914
Date of Issued
2004-11
Language
English
Handle URL
https://hdl.handle.net/11094/51705
PISSN
09168516
NCID
AA10826261
Relation.references
URI
https://search.ieice.org/
Access Rights
open access
CopyRight
copyright©2004 IEICE
oaire:version
Version of Record
Category
学術雑誌論文 Journal Article