Defect imaging from a remote distance by using scanning laser source technique with acoustic microphones

Maeda, Atsuya; Hayashi, Takahiro

Materials Transactions, 2018, 59(2), 320-323

Number of Access:3822025-11-13 08:33 Counts

Identifier to cite or link to this item: https://hdl.handle.net/11094/84555

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