Fast and Exact Outlier Detection in Metric Spaces: A Proximity Graph-based Approach

Amagata, Daichi; Onizuka, Makoto; Hara, Takahiro

Proceedings of the ACM SIGMOD International Conference on Management of Data, 2021, 36-48

Number of Access:5612025-10-07 03:55 Counts

Identifier to cite or link to this item: https://hdl.handle.net/11094/92849

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